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Oral presentation

LET dependence of dielectric breakdown of SiC MOS capacitors due to ion irradiation

Deki, Manato; Makino, Takahiro; Tomita, Takuro*; Hashimoto, Shuichi*; Kojima, Kazutoshi*; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Enhancement of ion induced charge in SiC shottky barrier diodes

Makino, Takahiro; Deki, Manato; Iwamoto, Naoya; Onoda, Shinobu; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Oshima, Takeshi

no journal, , 

no abstracts in English

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